ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,601, issued on Sept. 23, was assigned to Radiant Opto Electronics (Suzhou) Co. Ltd. (Jiangsu, China) and Radiant Opto-Electronics Corp. (Ka... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,420,538, issued on Sept. 23, was assigned to O-WELL Corp. (Osaka, Japan). "Transfer sheet for forming recessed and projecting shape, method of... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,426, issued on Sept. 23, was assigned to SOUTHWEST RESEARCH INSTITUTE (San Antonio). "Electrically insulated block-on-rotating-ring test u... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,423,446, issued on Sept. 23, was assigned to Tethers UnLtd. Inc. (Bothell, Wash.). "Integrated cryptographic circuits in space applications" w... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,116, issued on Sept. 23, was assigned to APPLETON GRP LLC (Rosemont, Ill.). "Hazardous area lighting with emergency power back up and wire... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,420,666, issued on Sept. 23, was assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT Co. LTD. (Osaka, Japan). "Information processing metho... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,426,308, issued on Sept. 23, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor device" was invented by Beom... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,420,178, issued on Sept. 23, was assigned to Razer (Asia-Pacific) Pte. Ltd. (Singapore). "Extendable controller" was invented by Gil Jr Palma ... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,420,825, issued on Sept. 23, was assigned to GM Cruise Holdings LLC (San Francisco). "Periodically mapping calibration scene for calibrating a... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,425,111, issued on Sept. 23, was assigned to KEYSIGHT TECHNOLOGIES INC. (Santa Rosa, Calif.). "Method and system for testing device under test... Read More