ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,421,669, issued on Sept. 23, was assigned to HUHTAMAKI MOLDED FIBER TECHNOLOGY B.V. (Leeuwarden, Netherlands). "Method and system for manufact... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,423,487, issued on Sept. 23, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Multi-locational forecast modeling in both... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,378, issued on Sept. 23, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Substrate defect analysis" was invented by Seng Ke... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,420,372, issued on Sept. 23, was assigned to Kistler Holding AG (Winterthur, Switzerland). "Cutting machine comprising a force transducer, use... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,424,321, issued on Sept. 23, was assigned to Paige.AI Inc. (New York). "Systems and methods to process electronic images to predict biallelic ... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,425,789, issued on Sept. 23, was assigned to Bang & Olufsen A/S (Struer, Denmark). "Method and system for surround sound setup using microphon... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,424,032, issued on Sept. 23, was assigned to Allstate Insurance Co. (Northbrook, Ill.). "Processing system for dynamic collision verification ... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,421,867, issued on Sept. 23, was assigned to General Electric Co. (Evendale, Ohio). "System and method for determining probabilistic burst" wa... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,425,279, issued on Sept. 23, was assigned to NIPPON TELEGRAPH AND TELEPHONE Corp. (Tokyo) and NTT INNOVATIVE DEVICES Corp. (Yokohama, Japan). ... Read More
ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,421,604, issued on Sept. 23, was assigned to Tokyo Electron Ltd. (Tokyo). "Ultra-shallow dopant and ohmic contact regions by solid state diffu... Read More