ALEXANDRIA, Va., July 23 -- United States Patent no. 12,366,531, issued on July 22, was assigned to SONY GROUP Corp. (Tokyo). "Data generation method, fluorescence observation system, and information... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. 12,367,001, issued on July 22, was assigned to Canon K.K. (Tokyo). "Storage medium, computer, and method related to application for providing prin... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. 12,367,943, issued on July 22, was assigned to Intel Corp. (Santa Clara, Calif.). "Reference voltage adjustment per path for high speed memory sig... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. D1,084,669, issued on July 22. "Electric spin scrubber" was invented by Jianjun Luo (Shenzhen, China). The patent was filed on Oct. 28, 2024, und... Read More
U.S., July 23 -- An application to own the trademark for 'XYPHOR' has been filed on Dec. 17, 2024. Owner(s): Hui Liu; Bao'an District, Room 110, No. 101, Xixingye Road, CHINA Goods and/or Services:... Read More
U.S., July 23 -- An application to own the trademark for 'TIMICAT' has been filed on Dec. 17, 2024. Owner(s): Wei, Benwei; Shitun Town, Wangmo County, Xintun Group, Hongxing Village, CHINA Goods an... Read More
U.S., July 23 -- An application to own the trademark for 'TNIRVO' has been filed on Dec. 17, 2024. Owner(s): Xia, Chunlan; Fenglingtou Town, Shangrao County,, No. 31, Liujia, Wangjiadian Village,, C... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. 12,367,388, issued on July 22, was assigned to QUALCOMM Inc. (San Diego). "Gain scaling of input to neural network for end-to-end learning in wire... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. 12,368,825, issued on July 22, was assigned to FUJIFILM Corp. (Tokyo). "Control apparatus, control method, and program" was invented by Tomoharu S... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. 12,366,538, issued on July 22, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Defect inspection apparatus and defect inspection method" was inv... Read More