Exclusive

Publication

Byline

INTERNATIONAL PATENT: TMEIC CORPORATION, 株式会社TMEIC FILES APPLICATION FOR "POWER SUPPLY DEVICE"

GENEVA, Dec. 22 -- TMEIC CORPORATION (3-1-1, Kyobashi, Chuo-ku, Tokyo1040031), 株式会社TMEIC (東京都中央&#21306... Read More


INTERNATIONAL PATENT: NTT DOCOMO, INC., 株式会社NTTドコモ FILES APPLICATION FOR "INFORMATION PROCESSING DEVICE AND ESTIMATION METHOD"

GENEVA, Dec. 22 -- NTT DOCOMO, INC. (11-1, Nagatacho 2-chome, Chiyoda-ku, Tokyo1006150), 株式会社NTTドコモ (東京都&#213... Read More


INTERNATIONAL PATENT: FUJI CORPORATION, 株式会社FUJI FILES APPLICATION FOR "CARE GIVING DEVICE"

GENEVA, Dec. 22 -- FUJI CORPORATION (19, Chausuyama, Yamamachi, Chiryu-shi, Aichi4728686), 株式会社FUJI (愛知県知立&#2... Read More


INTERNATIONAL PATENT: NISSAN MOTOR CO., LTD., 日産自動車株式会社 FILES APPLICATION FOR "BATTERY CONTROL METHOD AND BATTERY SYSTEM"

GENEVA, Dec. 22 -- NISSAN MOTOR CO., LTD. (2, Takara-cho, Kanagawa-ku, Yokohama-shi, Kanagawa2208623), 日産自動車株式会社 (神奈&#24029... Read More


INTERNATIONAL PATENT: NTT, INC., NTT株式会社 FILES APPLICATION FOR "OPTICAL ELEMENT"

GENEVA, Dec. 22 -- NTT, INC. (5-1, Otemachi 1-chome, Chiyoda-ku, Tokyo1008116), NTT株式会社 (東京都千代田区&#2282... Read More


INTERNATIONAL PATENT: NISSAN MOTOR CO., LTD., 日産自動車株式会社 FILES APPLICATION FOR "VEHICLE CONTROL METHOD AND VEHICLE CONTROL DEVICE"

GENEVA, Dec. 22 -- NISSAN MOTOR CO., LTD. (2, Takara-cho, Kanagawa-ku, Yokohama-shi, Kanagawa2208623), 日産自動車株式会社 (神奈&#24029... Read More


INTERNATIONAL PATENT: JFE ENGINEERING CORPORATION, JFEエンジニアリング株式会社 FILES APPLICATION FOR "DIMENSION MEASUREMENT METHOD, DIMENSION MEASUREMENT SYSTEM AND CONSTRUCTION PREPARATION METHOD"

GENEVA, Dec. 22 -- JFE ENGINEERING CORPORATION (2-2-3 Uchisaiwai-cho, Chiyoda-ku, Tokyo1000011), JFEエンジニアリング株&#24335... Read More


INTERNATIONAL PATENT: PEACE FIELD LLC, PEACE FIELD合同会社 FILES APPLICATION FOR "ROBOT SIMULATION SYSTEM"

GENEVA, Dec. 22 -- PEACE FIELD LLC (10-7, Honcho, Utsunomiya-shi, Tochigi3200033), Peace Field合同会&#310... Read More


INTERNATIONAL PATENT: MITSUBISHI ELECTRIC CORPORATION, 三菱電機株式会社 FILES APPLICATION FOR "METHOD FOR TESTING SEMICONDUCTOR CHIP"

GENEVA, Dec. 22 -- MITSUBISHI ELECTRIC CORPORATION (7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo1008310), 三菱電機株式会社 (東京都&#2131... Read More


INTERNATIONAL PATENT: MITSUBISHI ELECTRIC CORPORATION, 三菱電機株式会社 FILES APPLICATION FOR "DRIVE UNIT AND CONVEYANCE DEVICE"

GENEVA, Dec. 22 -- MITSUBISHI ELECTRIC CORPORATION (7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo1008310), 三菱電機株式会社 (東京都&#2131... Read More