INTERNATIONAL PATENT: AGC INC., ＡＧＣ株式会社 FILES APPLICATION FOR "MIRROR SURFACE SHAPE MEASUREMENT DEVICE, MIRROR SURFACE SHAPE MEASUREMENT METHOD AND PLATE GLASS MANUFACTURING METHOD"

GENEVA, Dec. 9 -- AGC INC. (5-1, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008405), ＡＧＣ株式会社 (東京都千代田区&#2002... Read More

INTERNATIONAL PATENT: SHIN-ETSU CHEMICAL CO., LTD., 信越化学工業株式会社 FILES APPLICATION FOR "RARE EARTH SINTERED MAGNET AND METHOD FOR PRODUCING SAME"

GENEVA, Dec. 9 -- SHIN-ETSU CHEMICAL CO., LTD. (4-1, Marunouchi 1-chome, Chiyoda-ku, Tokyo1000005), 信越化学工業株式会社 (東京&#... Read More

INTERNATIONAL PATENT: PROTERIAL, LTD., 株式会社プロテリアル FILES APPLICATION FOR "METHOD FOR PRODUCING FE-CO-BASED ALLOY STRIP MATERIAL, FE-CO-BASED ALLOY STRIP MATERIAL AND LAMINATED CORE MEMBER"

GENEVA, Dec. 9 -- PROTERIAL, LTD. (6-36, Toyosu 5-chome, Koto-ku, Tokyo1350061), 株式会社プロテリアル (東京都江&#264... Read More

INTERNATIONAL PATENT: HITACHI, LTD., 株式会社日立製作所 FILES APPLICATION FOR "INFORMATION GENERATION DEVICE, INFORMATION GENERATION METHOD, VEHICLE, DISPLAY AND SPEAKER"

GENEVA, Dec. 9 -- HITACHI, LTD. (6-6, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008280), 株式会社日立製作所 (東京都千代&... Read More

INTERNATIONAL PATENT: TEIKYO UNIVERSITY, 学校法人帝京大学 FILES APPLICATION FOR "GENERATION MODEL TRAINING METHOD, TRAINING DEVICE, IMAGE GENERATION METHOD, IMAGE GENERATION DEVICE AND PROGRAM"

GENEVA, Dec. 9 -- TEIKYO UNIVERSITY (11-1, Kaga 2-chome, Itabashi-ku, Tokyo1738605), 学校法人帝京大学 (東京都板橋区&... Read More

INTERNATIONAL PATENT: TOKYO SEIMITSU CO., LTD., 株式会社東京精密 FILES APPLICATION FOR "WAFER DEFECT INSPECTION SYSTEM, WAFER DEFECT INSPECTION DEVICE AND WAFER DEFECT INSPECTION METHOD"

GENEVA, Dec. 9 -- TOKYO SEIMITSU CO., LTD. (2968-2, Ishikawa-machi, Hachioji-shi, Tokyo1928515), 株式会社東京精密 (東京都八&#295... Read More

INTERNATIONAL PATENT: SHIMADZU CORPORATION, 株式会社島津製作所 FILES APPLICATION FOR "DETECTION DEVICE AND DETECTION METHOD"

GENEVA, Dec. 9 -- SHIMADZU CORPORATION (1, Nishinokyo Kuwabara-cho, Nakagyo-ku, Kyoto-shi, Kyoto6048511), 株式会社島津製作所 (京都&#24... Read More

INTERNATIONAL PATENT: AMADA CO., LTD., 株式会社アマダ FILES APPLICATION FOR "WORKPIECE INTERFERENCE PREVENTION SYSTEM, WORKPIECE INTERFERENCE PREVENTION METHOD AND BENDING MACHINE"

GENEVA, Dec. 9 -- AMADA CO., LTD. (200, Ishida, Isehara-shi, Kanagawa2591196), 株式会社アマダ (神奈川県伊勢原&#24066... Read More

INTERNATIONAL PATENT: NEC CORPORATION, 日本電気株式会社, NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, 国立研究開発法人産業技術総合研究所 FILES APPLICATION FOR "LEARNING DEVICE, CONTROL DEVICE, LEARNING METHOD AND RECORDING MEDIUM"

GENEVA, Dec. 9 -- NEC CORPORATION (7-1, Shiba 5-chome, Minato-ku, Tokyo1088001), 日本電気株式会社 (東京都港区芝&#201... Read More

INTERNATIONAL PATENT: NISSHINBO MICRO DEVICES INC., 日清紡マイクロデバイス株式会社 FILES APPLICATION FOR "DA CONVERSION DEVICE AND AD CONVERSION DEVICE"

GENEVA, Dec. 9 -- NISSHINBO MICRO DEVICES INC. (3-10, Nihonbashi Yokoyama-cho, Chuo-ku, Tokyo1038456), 日清紡マイクロデバイス株&... Read More

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