ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,601, issued on Jan. 13, was assigned to Konica Minolta Inc. (Tokyo). "Gas detection device, gas detection method, and gas detection program... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. D1,108,933, issued on Jan. 13, was assigned to Lutron Technology Co. LLC (Coopersburg, Pa.). "Bracket applied to a window treatment" was invented ... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,525,380, issued on Jan. 13, was assigned to LG INNOTEK Co. LTD. (Seoul, South Korea). "Magnetic element and circuit board comprising the same" ... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. D1,109,407, issued on Jan. 13. "Fragrance lamp" was invented by Guilin Zhao (Shantou, China). The patent was filed on April 15, 2025, under Appli... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,520,931, issued on Jan. 13, was assigned to F.G. ELLIOTT LLC (State College, Pa.). "Rotating bristle device and method of use" was invented by ... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,527,078, issued on Jan. 13, was assigned to Intel Corp. (Santa Clara, Calif.). "Gate-all-around integrated circuit structures having epitaxial ... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,526,638, issued on Jan. 13, was assigned to Pismo Labs Technology Ltd. (Kowloon, Hong Kong). "Methods and systems for allowing device to send a... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,525,506, issued on Jan. 13, was assigned to Adeia Semiconductor Bonding Technologies Inc. (San Jose, Calif.). "Embedded cooling systems for adv... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,522,885, issued on Jan. 13, was assigned to ArcelorMittal (Luxembourg). "Hot rolled steel and a method of manufacturing thereof" was invented b... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,525,425, issued on Jan. 13, was assigned to NuFlare Technology Inc. (Yokohama, Japan). "Pattern inspection apparatus, and method for acquiring ... Read More