India, July 11 -- Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as defects are being inspected - all on a single tool.

This patented capability is called WaferWeight and it integrates fully into Microtronic's EAGLEview line of high-speed macro defect inspection systems. It can be added to the latest EAGLEview 6, and also to previous models of the tool.

"Wafer mass metrology has become increasingly important as semiconductor processes have become more complex and sensitive," said Microtronic CEO, Reiner Fenske, in making the announcement.

"Today's fabs would like to be able to measure the wafer...