India, May 20 -- Eumetrys, a leading global integrator of comprehensive turnkey metrology and inspection equipment solutions enabling chip makers to meet their wafer fab financial and productivity goals, today announced at Booth 707 that it has been awarded the global exclusive distribution of the YPI - Clear Scanner manufactured by Japanese company YGK.

This laser scanning particle inspection tool for un-patterned compound semiconductor substrates greatly enhanced the quality control of semiconductors by inspecting the surface of various opaque and transparent wafers, including silicon carbide (SiC), gallium nitride (GaN), indium phosphide (InP), Sapphire, gallium arsenide (GaAs), silicon, and glass. Defective silicon wafers could cost ...