ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,491,267, issued on Dec. 9, was assigned to The Brigham and Women's Hospital Inc. (Boston). "Gene therapy for neurodegenerative disorders" was in... Read More
ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,493,485, issued on Dec. 9, was assigned to HUAWEI TECHNOLOIGES Co. LTD. (Shenzhen, China). "Method and apparatus for processing interrupt reques... Read More
ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,495,308, issued on Dec. 9, was assigned to Boost SubscriberCo LLC (Englewood, Colo.). "Systems and methods for flexible access to priority acces... Read More
ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,494,456, issued on Dec. 9, was assigned to UNITED MICROELECTRONICS CORP (Hsinchu, Taiwan). "Semiconductor assembly and method for manufacturing ... Read More
ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,495,520, issued on Dec. 9, was assigned to BEIJING YOUZHUJU NETWORK TECHNOLOGY Co. LTD. (Beijing). "Air-liquid cooling system using seasonal tem... Read More
ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,494,156, issued on Dec. 9, was assigned to LX SEMICON Co. LTD. (Daejeon, South Korea). "Data receiving device, data receiving method, and data c... Read More
ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,490,729, issued on Dec. 9, was assigned to Shimano Inc. (Osaka, Japan). "Dual-bearing reel" was invented by Kouhei Nakamura (Osaka, Japan) and S... Read More
ALEXANDRIA, Va., Dec. 9 -- United States Patent no. D1,105,167, issued on Dec. 9, was assigned to Aristocrat Technologies Inc. (Las Vegas). "Display screen or portion thereof with transitional graphi... Read More
ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,491,185, issued on Dec. 9, was assigned to NRG THERAPEUTICS LTD (Stevenage, Great Britain). "Inhibitors of mPTP" was invented by Neil Miller (St... Read More
ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,493,246, issued on Dec. 9, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Overlay measurement method, semiconductor devi... Read More