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INTERNATIONAL PATENT: KABUSHIKI KAISHA TOKAI RIKA DENKI SEISAKUSHO, 株式会社東海理化電機製作所 FILES APPLICATION FOR "DETECTION DEVICE"

GENEVA, Sept. 16 -- KABUSHIKI KAISHA TOKAI RIKA DENKI SEISAKUSHO (260, Toyota 3-chome, Oguchi-cho, Niwa-gun, Aichi4800195), 株式会社東海理化電&#27... Read More


INTERNATIONAL PATENT: KAWASAKI JUKOGYO KABUSHIKI KAISHA, 川崎重工業株式会社 FILES APPLICATION FOR "MULTI-CONTROL VALVE"

GENEVA, Sept. 16 -- KAWASAKI JUKOGYO KABUSHIKI KAISHA (1-1, Higashikawasaki-cho 3-chome, Chuo-ku, Kobe-shi, Hyogo6508670), 川崎重工業株式会社 (&#2... Read More


INTERNATIONAL PATENT: SONY GROUP CORPORATION, ソニーグループ株式会社 FILES APPLICATION FOR "IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD AND PROGRAM"

GENEVA, Sept. 16 -- SONY GROUP CORPORATION (1-7-1, Konan, Minato-ku, Tokyo1080075), ソニーグループ株式会社 (東京都&#... Read More


INTERNATIONAL PATENT: SONY SEMICONDUCTOR SOLUTIONS CORPORATION, ソニーセミコンダクタソリューションズ株式会社 FILES APPLICATION FOR "TRANSMISSION DEVICE, TRANSMISSION METHOD, RECEPTION DEVICE AND RECEPTION METHOD"

GENEVA, Sept. 16 -- SONY SEMICONDUCTOR SOLUTIONS CORPORATION (4-14-1, Asahi-cho, Atsugi-shi, Kanagawa2430014), ソニーセミコンダクタソ&... Read More


INTERNATIONAL PATENT: AESC JAPAN LTD., 株式会社AESCジャパン FILES APPLICATION FOR "BATTERY PACK"

GENEVA, Sept. 16 -- AESC JAPAN LTD. (K-Tower Yokohama, 6-2-12 Minatomirai, Nishi-ku, Yokohama-shi, Kanagawa2200012), 株式会社AESCジャ&#1... Read More


INTERNATIONAL PATENT: NEC CORPORATION, 日本電気株式会社 FILES APPLICATION FOR "DIAGNOSIS EXPLANATION ASSISTANCE DEVICE, DIAGNOSIS EXPLANATION ASSISTANCE METHOD AND RECORDING MEDIUM"

GENEVA, Sept. 16 -- NEC CORPORATION (7-1, Shiba 5-chome, Minato-ku, Tokyo1088001), 日本電気株式会社 (東京都港区芝&#2... Read More


INTERNATIONAL PATENT: NEC CORPORATION FILES APPLICATION FOR "METHOD PERFORMED BY FIRST ACCESS NETWORK NODE, METHOD PERFORMED BY SECOND ACCESS NETWORK NODE, FIRST ACCESS NETWORK NODE AND SECOND ACCESS NETWORK NODE"

GENEVA, Sept. 16 -- NEC CORPORATION (7-1, Shiba 5-chome, Minato-ku, Tokyo1088001) filed a patent application (PCT/JP2025/005013) for "METHOD PERFORMED BY FIRST ACCESS NETWORK NODE, METHOD PERFORMED BY... Read More


INTERNATIONAL PATENT: HAMAMATSU PHOTONICS K.K., 浜松ホトニクス株式会社 FILES APPLICATION FOR "DETECTOR UNIT, RADIATION DETECTION DEVICE AND RADIATION TOMOGRAPHY DEVICE"

GENEVA, Sept. 16 -- HAMAMATSU PHOTONICS K.K. (1126-1, Ichino-cho, Chuo-ku, Hamamatsu-shi, Shizuoka4358558), 浜松ホトニクス株式会社 (&#... Read More


INTERNATIONAL PATENT: JAPAN DISPLAY INC., 株式会社ジャパンディスプレイ FILES APPLICATION FOR "METHOD FOR MANUFACTURING INTERPOSER AND INTERPOSER"

GENEVA, Sept. 16 -- JAPAN DISPLAY INC. (3-7-1 Nishi-shinbashi, Minato-ku, Tokyo1050003), 株式会社ジャパンディスプレ&#12452... Read More


INTERNATIONAL PATENT: ASAHI KASEI KABUSHIKI KAISHA, 旭化成株式会社 FILES APPLICATION FOR "CONJUGATED-DIENE COPOLYMER, CONJUGATED-DIENE COPOLYMER COMPOSITION, RESIN COMPOSITION, CURED OBJECT, RESIN FILM, PREPREG, LAMINATE AND MATERIAL FOR ELECTRONIC CIRCUIT BOARD"

GENEVA, Sept. 16 -- ASAHI KASEI KABUSHIKI KAISHA (1-1-2 Yurakucho, Chiyoda-ku, Tokyo1000006), 旭化成株式会社 (東京都千代田... Read More