INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "ABNORMALITY CAUSE ANALYSIS SYSTEM AND ABNORMALITY CAUSE ANALYSIS METHOD"

GENEVA, Aug. 18 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京&... Read More

INTERNATIONAL PATENT: NTT DOCOMO, INC., 株式会社ＮＴＴドコモ FILES APPLICATION FOR "NETWORK COMPONENT AND RADIO COMMUNICATION METHOD"

GENEVA, Aug. 18 -- NTT DOCOMO, INC. (11-1, Nagatacho 2-chome, Chiyoda-ku, Tokyo1006150), 株式会社ＮＴＴドコモ (東京都&#213... Read More

INTERNATIONAL PATENT: OLYMPUS MEDICAL SYSTEMS CORP., オリンパスメディカルシステムズ株式会社 FILES APPLICATION FOR "RECOMMENDATION METHOD, RECOMMENDATION DEVICE, PROGRAM AND RECOMMENDATION SYSTEM"

GENEVA, Aug. 18 -- OLYMPUS MEDICAL SYSTEMS CORP. (2951, Ishikawa-machi, Hachioji-shi, Tokyo1928507), オリンパスメディカルシス&#1... Read More

INTERNATIONAL PATENT: FUJI CORPORATION, 株式会社ＦＵＪＩ FILES APPLICATION FOR "ATTACHING/DETACHING MECHANISM AND ARTICLE CONVEYING DEVICE"

GENEVA, Aug. 18 -- FUJI CORPORATION (19, Chausuyama, Yamamachi, Chiryu-shi, Aichi4728686), 株式会社ＦＵＪＩ (愛知県知立&#2... Read More

INTERNATIONAL PATENT: NTT DOCOMO, INC., 株式会社ＮＴＴドコモ FILES APPLICATION FOR "TERMINAL AND METHOD"

GENEVA, Aug. 18 -- NTT DOCOMO, INC. (11-1, Nagatacho 2-chome, Chiyoda-ku, Tokyo1006150), 株式会社ＮＴＴドコモ (東京都&#213... Read More

INTERNATIONAL PATENT: FUJITA ACADEMY, 学校法人藤田学園 FILES APPLICATION FOR "TEST METHOD FOR EMBRYONIC CHROMOSOMAL ANEUPLOIDY"

GENEVA, Aug. 18 -- FUJITA ACADEMY (1-98, Dengakugakubo, Kutsukake-cho, Toyoake-shi, Aichi4701192), 学校法人藤田学園 (愛知県豊&#2... Read More

INTERNATIONAL PATENT: YAMAHA HATSUDOKI KABUSHIKI KAISHA, ヤマハ発動機株式会社 FILES APPLICATION FOR "COMPONENT HOLDING MEMBER PROCESSING METHOD, COMPONENT HOLDING MEMBER MANAGEMENT METHOD, COMPONENT HOLDING MEMBER AND COMPONENT MOUNTING MACHINE"

GENEVA, Aug. 18 -- YAMAHA HATSUDOKI KABUSHIKI KAISHA (2500, Shingai, Iwata-shi, Shizuoka4388501), ヤマハ発動機株式会社 (静岡&#30... Read More

INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD"

GENEVA, Aug. 18 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京&... Read More

INTERNATIONAL PATENT: NTT, INC., ＮＴＴ株式会社 FILES APPLICATION FOR "REDUNDANCY SYSTEM, REDUNDANCY METHOD AND REDUNDANCY PROGRAM"

GENEVA, Aug. 18 -- NTT, INC. (5-1, Otemachi 1-chome, Chiyoda-ku, Tokyo1008116), ＮＴＴ株式会社 (東京都千代田区&#2282... Read More

INTERNATIONAL PATENT: NTT DOCOMO, INC., 株式会社ＮＴＴドコモ FILES APPLICATION FOR "NETWORK NODE AND COMMUNICATION METHOD"

GENEVA, Aug. 18 -- NTT DOCOMO, INC. (11-1, Nagatacho 2-chome, Chiyoda-ku, Tokyo1006150), 株式会社ＮＴＴドコモ (東京都&#213... Read More

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