ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,541,096, issued on Feb. 3, was assigned to VIENEX Corp. (Kagawa, Japan). "Optical line sensor" was invented by Ryuta Watanabe (Kanonji, Japan) a... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,303, issued on Feb. 3, was assigned to NINGDE AMPEREX TECHNOLOGY Ltd. (Ningde, China). "Electrochemical device" was invented by Qiang Tao (F... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,541,391, issued on Feb. 3, was assigned to VMware LLC (Palo Alto, Calif.). "Methods and systems for virtual machine migration during controller ... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,540,394, issued on Feb. 3, was assigned to Tokyo Electron Ltd. (Tokyo). "Selective film formation using self-assembled monolayer" was invented b... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,120, issued on Feb. 3, was assigned to The Regents of the University of California (Oakland, Calif.). "Cardiac and vascular noise cancellati... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,541,832, issued on Feb. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Image-statistics-based de-banding in SDR to HD... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,782, issued on Feb. 3, was assigned to Bank of America Corp. (Charlotte, N.C.). "Controlling access to secure information resources using ro... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,540,461, issued on Feb. 3. "Shower" was invented by Yupeng Zhang (Jieyang, China). According to the abstract* released by the U.S. Patent & Tra... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,541,023, issued on Feb. 3, was assigned to Shenzhen Yinwang Intelligent Technologies Co. Ltd. (Shenzhen, China). "Imaging method and apparatus, ... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,543,540, issued on Feb. 3, was assigned to KLA Corp. (Milpitas, Calif.). "High resolution profile measurement based on a trained parameter condi... Read More