ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,209, issued on Oct. 28, was assigned to ZHEJIANG UNIVERSITY (Hangzhou, China). "Gas permeation and leakage rate testing device and method f... Read More
ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,456,495, issued on Oct. 28, was assigned to NBCUNIVERSAL MEDIA LLC (Universal City, Calif.). "Identifying video segments using audio spectrogra... Read More
ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,457,300, issued on Oct. 28, was assigned to Adobe Inc. (San Jose, Calif.). "Generating stylized images on mobile devices" was invented by Wenti... Read More
ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,457,785, issued on Oct. 28, was assigned to Imec vzw (Leuven, Belgium). "Method for forming a stacked FET device" was invented by Boon Teik Cha... Read More
ALEXANDRIA, Va., Oct. 28 -- United States Patent no. D1,100,291, issued on Oct. 28, was assigned to Zhongshan Shengdian Lighting Co. Ltd. (Zhongshan, China). "Ceiling fan with lamp" was invented by C... Read More
ALEXANDRIA, Va., Oct. 28 -- United States Patent no. D1,100,160, issued on Oct. 28, was assigned to Rheem Manufacturing Co. (Atlanta). "Packaged terminal air conditioner" was invented by Geethakrishn... Read More
ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,454,885, issued on Oct. 28, was assigned to Schlumberger Technology Corp. (Sugar Land, Texas). "Bore plug analysis system" was invented by Teri... Read More
ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,456,655, issued on Oct. 28, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Passivation layer for a semiconduct... Read More
ALEXANDRIA, Va., Oct. 28 -- United States Patent no. D1,099,846, issued on Oct. 28, was assigned to TE Connectivity Brasil Industria De Eletronicos Ltda (Bragnaca Paulista, Brazil). "Connector" was i... Read More
ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,315, issued on Oct. 28, was assigned to MediaTek Inc. (Hsinchu, Taiwan). "Chip with power-glitch detection and power-glitch self-testing" w... Read More