ALEXANDRIA, Va., July 30 -- United States Patent no. 12,371,827, issued on July 29, was assigned to Centre for Perceptual and Interactive Intelligence (CPII) Ltd. (Hong Kong, Hong Kong). "Control com... Read More
ALEXANDRIA, Va., July 30 -- United States Patent no. 12,371,145, issued on July 29, was assigned to Airbus Operations Ltd. (Bristol, Great Britain). "Duct stringer assembly with bulkhead" was invente... Read More
ALEXANDRIA, Va., July 30 -- United States Patent no. 12,371,299, issued on July 29. "System for deflecting an intermediate item in a folding unit" was invented by Sanjay Madhav Dandekar (Pune, India)... Read More
ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,552, issued on July 29, was assigned to TYCO ELECTRONICS (SHANGHAI) Co. LTD. (Shanghai). "Detection mechanism, wire positioning apparatus, ... Read More
ALEXANDRIA, Va., July 30 -- United States Patent no. D1,086,139, issued on July 29, was assigned to Getac Technology Corp. (New Taipei, Taiwan). "Keyboard dock" was invented by Shi-Liang Zhong (Taipe... Read More
ALEXANDRIA, Va., July 30 -- United States Patent no. 12,373,928, issued on July 29, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei, Taiwan). "Image correction method and computing de... Read More
ALEXANDRIA, Va., July 30 -- United States Patent no. 12,370,301, issued on July 29, was assigned to Stryker Corp. (Portage, Mich.). "Suction and irrigation device" was invented by Andrew T. Forsberg ... Read More
ALEXANDRIA, Va., July 30 -- United States Patent no. 12,376,410, issued on July 29, was assigned to Semiconductor Energy Laboratory Co. Ltd. (Atsugi, Japan). "Imaging device with embedded conductive ... Read More
ALEXANDRIA, Va., July 30 -- United States Patent no. 12,374,933, issued on July 29, was assigned to LG INNOTEK Co. LTD. (Seoul, South Korea). "Method for detecting foreign material, and device and sy... Read More
ALEXANDRIA, Va., July 30 -- United States Patent no. 12,374,571, issued on July 29, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Displacement measurements in semiconductor wafer pro... Read More