US Patent Issued to Microsoft Technology Licensing on Jan. 13 for "Finding semantically related security information" (New Jersey, Washington, Massachusetts, California Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,678, issued on Jan. 13, was assigned to Microsoft Technology Licensing LLC (Redmond, Wash.). "Finding semantically related security informa... Read More

US Patent Issued to Dell Products on Jan. 13 for "Cloning a clustered file system" (American, Indian Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,379, issued on Jan. 13, was assigned to Dell Products LP (Round Rock, Texas). "Cloning a clustered file system" was invented by Ramesh Kann... Read More

US Patent Issued to LG Electronics on Jan. 13 for "Method and apparatus for performing measurement under a long propagation delay in a wireless communication system" (South Korean Inventor)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,526,664, issued on Jan. 13, was assigned to LG Electronics Inc. (Seoul, South Korea). "Method and apparatus for performing measurement under a ... Read More

US Patent Issued to QUALCOMM on Jan. 13 for "Positioning fusion based on information from sidelink device" (California, New Jersey Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,526,763, issued on Jan. 13, was assigned to QUALCOMM Inc. (San Diego). "Positioning fusion based on information from sidelink device" was inven... Read More

US Patent Issued to MITSUBISHI ELECTRIC on Jan. 13 for "Floating image display device and floating image display method" (Japanese Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,883, issued on Jan. 13, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo). "Floating image display device and floating image display method... Read More

US Patent Issued to HITACHI HIGH-TECH ANALYSIS on Jan. 13 for "X-ray inspection apparatus and method of inspection with X-rays" (Japanese Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,620, issued on Jan. 13, was assigned to HITACHI HIGH-TECH ANALYSIS Corp. (Tokyo). "X-ray inspection apparatus and method of inspection with... Read More

US Patent Issued to Norgren on Jan. 13 for "Pressure adjustment apparatus" (German Inventor)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,310, issued on Jan. 13, was assigned to Norgren GmbH (Alpen, Germany). "Pressure adjustment apparatus" was invented by Ulrich Teschke (Rhei... Read More

US Patent Issued to IDEMIA PUBLIC SECURITY FRANCE on Jan. 13 for "System for acquiring a colour image and an infrared image of a scene" (French Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,526,491, issued on Jan. 13, was assigned to IDEMIA PUBLIC SECURITY FRANCE (Courbevoie, France). "System for acquiring a colour image and an inf... Read More

US Patent Issued to Dell Products on Jan. 13 for "Logic rule-based relative support and confidence for semi-structured document content extraction" (Brazilian Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,456, issued on Jan. 13, was assigned to Dell Products LP (Round Rock, Texas). "Logic rule-based relative support and confidence for semi-st... Read More

US Patent Issued to ZTE on Jan. 13 for "Information determination method and apparatus, device, and storage medium" (Chinese Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,526,816, issued on Jan. 13, was assigned to ZTE Corp. (Shenzhen, China). "Information determination method and apparatus, device, and storage m... Read More

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