ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,483,585, issued on Nov. 25, was assigned to Dell Products LP (Round Rock, Texas). "System and method for identifying security threats based on ... Read More
ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,479,544, issued on Nov. 25, was assigned to North China University of Science and Technology (Tangshan, China). "Unmanned survey vessel with an... Read More
ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,479,167, issued on Nov. 25, was assigned to PINWELD Ltd. (Calne, Great Britain). "Polymeric pipe welding apparatus" was invented by Keven Chapp... Read More
ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,394, issued on Nov. 25, was assigned to CONOCOPHILLPS COMPANY (Houston). "Method and apparatus for acid stimulation" was invented by Jan Ov... Read More
ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,482,298, issued on Nov. 25, was assigned to ULTRAHAPTICS IP TWO Ltd. (Bristol, Great Britain). "Biometric aware object detection and tracking" ... Read More
ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,237, issued on Nov. 25, was assigned to REIFENHAEUSER GMBH & Co. KG MASCHINENFABRIK (Troisdorf, Germany). "Manufacture of spunbonded nonwov... Read More
ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,889, issued on Nov. 25, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel). "Inspection recipe optimization for semiconductor ... Read More
ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,479,227, issued on Nov. 25, was assigned to NOTION SYSTEMS GMBH (Schwetzingen, Germany). "Method and device for printing on a substrate by way ... Read More
ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,484,074, issued on Nov. 25, was assigned to QUALCOMM Inc. (San Diego). "Resource sharing between base stations and anchor user equipments on si... Read More
ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,400, issued on Nov. 25, was assigned to Massachusetts Institute of Technology (Cambridge, Mass.). "Rate of penetration/depth monitor for a ... Read More