Carl Zeiss Microscopy Deutschland GmbH secures contract for Scanning electron microscopes - Precise ion beam based trenching tool (IMWS-032) high performance Ga-FIB sample preparation (IMWS-081) high performance analyical SEM inspection (IMWS-082) - PR924050-2690-P

Germany, Dec. 10 -- Germany based Carl Zeiss Microscopy Deutschland GmbH has secured contract from TESCAN GmbH for Scanning electron microscopes - Precise ion beam based trenching tool (IMWS-032) high performance Ga-FIB sample preparation (IMWS-081) high performance analyical SEM inspection (IMWS-082) - PR924050-2690-P. The value of the contract is not disclosed.

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