Japan, Jan. 28 -- SAXA INC has got intellectual property rights for 'RELAY PROCESSING DEVICE.' Other related details are as follows: Application Number: JP,2022-121412 Category (FI): H04L47/12,H04L6... Read More
Japan, Jan. 28 -- COLOPL INC has got intellectual property rights for 'PROGRAM AND INFORMATION PROCESSING SYSTEM.' Other related details are as follows: Application Number: JP,2022-121138 Category (... Read More
Japan, Jan. 28 -- YOSHINO KOGYOSHO CO LTD has got intellectual property rights for 'TRIGGER TYPE LIQUID EJECTOR.' Other related details are as follows: Application Number: JP,2022-120145 Category (F... Read More
Japan, Jan. 28 -- HITACHI LTD has got intellectual property rights for 'IDENTITY MANAGEMENT SYSTEM AND IDENTITY MANAGEMENT METHOD.' Other related details are as follows: Application Number: JP,2022-1... Read More
Japan, Jan. 28 -- DISCO ABRASIVE SYST LTD has got intellectual property rights for 'WAFER PROCESSING METHOD.' Other related details are as follows: Application Number: JP,2022-118836 Category (FI): ... Read More
Japan, Jan. 28 -- TOSHIBA CORP has got intellectual property rights for 'PERMANENT MAGNET, ROTARY ELECTRIC MACHINE, VEHICLE, AND AIRCRAFT.' Other related details are as follows: Application Number: J... Read More
Japan, Jan. 28 -- MITSUBISHI SHIPBUILDING CO LTD has got intellectual property rights for 'TANK MANUFACTURING METHOD.' Other related details are as follows: Application Number: JP,2022-118610 Catego... Read More
Japan, Jan. 28 -- NOHMI BOSAI LTD has got intellectual property rights for 'HEAT DETECTOR.' Other related details are as follows: Application Number: JP,2023-194887 Category (FI): G08B17/00@G,G08B17... Read More
Japan, Jan. 28 -- MITSUBISHI ELECTRIC CORP has got intellectual property rights for 'GRID STABILIZATION DEVICE.' Other related details are as follows: Application Number: JP,2022-118232 Category (FI... Read More
Japan, Jan. 28 -- CANON TOKKI CORP has got intellectual property rights for 'FILM THICKNESS MEASUREMENT DEVICE, DEPOSITION DEVICE, FILM THICKNESS MEASUREMENT METHOD AND MANUFACTURING METHOD FOR ELECTR... Read More