ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,952, issued on Jan. 27, was assigned to Western Digital Technologies Inc. (San Jose, Calif.).

"Machine learning defect management in storage devices" was invented by Saket Giri (Bangalore, India), Anand Lallan Gupta (Bangalore, India), Jonathan Lloyd (Newport Beach, Calif.) and Amit Chattopadhyay (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods are provided for managing defects in Hard Disk Drive (HDD) storage devices. In particular, only a portion of the cylinders of an HDD is tested. A bag of machine learning models is used to reconstruct the data for the untested cylinders. A defect file for the HDD is generated, a classif...