GENEVA, March 24 -- SEB S.A. (112 chemin du Moulin CarronCampus SEB69130 ECULLY) filed a patent application (PCT/FR2024/051176) for "MULTIFUNCTIONAL ELECTRIC COOKING APPLIANCE" on Sep 09, 2024. With p... Read More
GENEVA, March 24 -- SEB S.A. (112 chemin du Moulin CarronCampus SEB69130 ECULLY) filed a patent application (PCT/FR2024/051179) for "MULTIFUNCTIONAL ELECTRIC COOKING APPLIANCE" on Sep 09, 2024. With p... Read More
GENEVA, March 24 -- SAFRAN AIRCRAFT ENGINES (2 boulevard du General Martial Valin75015 PARIS) filed a patent application (PCT/FR2024/051126) for "TURBINE ENGINE BLADE ASSEMBLY" on Aug 27, 2024. With p... Read More
GENEVA, March 24 -- SIEMENS AKTIENGESELLSCHAFT (Werner-von-Siemens-StraBe 180333 Munchen) filed a patent application (PCT/EP2023/075032) for "METHOD AND SYSTEM FOR LEAK DETECTION BASED ON INVERSE TRAN... Read More
GENEVA, March 24 -- TELEFONAKTIEBOLAGET LM ERICSSON (PUBL) (.SE-164 83 Stockholm) filed a patent application (PCT/EP2023/075477) for "USER EQUIPMENT, RADIO NETWORK NODE, AND METHODS FOR PERFORMING WIR... Read More
GENEVA, March 24 -- TELEFONAKTIEBOLAGET LM ERICSSON (PUBL) (SE-164 83 Stockholm) filed a patent application (PCT/EP2023/075387) for "METHODS FOR AI DRIVEN OPTIMIZATION OF INTENTS AND RESOURCE UTILIZAT... Read More
GENEVA, March 24 -- TRUTZSCHLER GROUP SE (Duvenstr. 82-9241199 Monchengladbach) filed a patent application (PCT/EP2024/071018) for "SPINNING CAN SUPPORTING DEVICE FOR ROTATING A SPINNING CAN, TEXTILE ... Read More
GENEVA, March 24 -- SIEMENS GAMESA RENEWABLE ENERGY A/S (Borupvej 167330 Brande) filed a patent application (PCT/EP2024/071831) for "CONTROL SYSTEM PROVIDING DROOP CONTROL AND WIND TURBINE" on Aug 01,... Read More
GENEVA, March 24 -- CEMEX INNOVATION HOLDING AG (General-Guisan-Strasse 66300 Zug) filed a patent application (PCT/EP2023/075386) for "FORMLESS PRODUCTION PROCESS TO PLACE A CONSTRUCTION MATERIAL IN A... Read More
GENEVA, March 24 -- ASML NETHERLANDS B.V. (P.O. Box 3245500 AH Veldhoven) filed a patent application (PCT/EP2024/072704) for "METHOD FOR DETERMINING ROOT CAUSES OF EVENTS OF A SEMICONDUCTOR MANUFACTUR... Read More