ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,949, issued on Sept. 30, was assigned to WESTLAKE UNIVERSITY (Hangzhou, China). "Origami-based contact members, devices and systems used f... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,345, issued on Sept. 30, was assigned to Jingdong Kunpeng (Jiangsu) Technology Co. Ltd. (Changshu, China). "Unmanned vehicle path optimiza... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,053, issued on Sept. 30, was assigned to TYCO FIRE & SECURITY GMBH (Neuhausen am Rheinfall, Switzerland) and JOHNSON CONTROLS AIR CONDITION... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,711, issued on Sept. 30, was assigned to LG Electronics Inc. (Seoul, South Korea). "Signal processing device and image display device comp... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,941, issued on Sept. 30, was assigned to HAINAN UNIVERSITY (Haikou, China) and SANYA RESEARCH INSTITUTE OF HAINAN UNIVERSITY (Sanya, China)... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,731, issued on Sept. 30, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Generation of three-dimensional (3D) looku... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,277, issued on Sept. 30, was assigned to PRODIGY TECHNOVATIONS PVT. LTD. (India). "Highly scalable architecture for PCIe Gen6 protocol ana... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,137, issued on Sept. 30, was assigned to Tenstorrent USA Inc.. "Processor with opportunistic bypass of dispatch buffer and reservation sta... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,433,045, issued on Sept. 30, was assigned to INNOLUX Corp. (Miao-Li County, Taiwan). "Sensing device, method of manufacturing sensing device a... Read More
ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,858, issued on Sept. 30, was assigned to Siemens AG (Munich). "Method and apparatus for monitoring a condition of a component of a process... Read More