INTERNATIONAL PATENT: THE UNIVERSITY OF OSAKA, 国立大学法人大阪大学 FILES APPLICATION FOR "DEVICE FOR SELECTIVELY COLLECTING TARGET COMPOUND, METHOD FOR MANUFACTURING SAID DEVICE AND METHOD FOR SELECTIVELY COLLECTING TARGET COMPOUND FROM BIOLOGICAL OR ENVIRONMENTAL SAMPLE"

GENEVA, Dec. 9 -- THE UNIVERSITY OF OSAKA (1-1, Yamadaoka, Suita-shi, Osaka5650871), 国立大学法人大阪大学 (大阪府吹&... Read More

INTERNATIONAL PATENT: SONY GROUP CORPORATION, ソニーグループ株式会社 FILES APPLICATION FOR "INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD AND INFORMATION PROCESSING PROGRAM"

GENEVA, Dec. 9 -- SONY GROUP CORPORATION (1-7-1, Konan, Minato-ku, Tokyo1080075), ソニーグループ株式会社 (東京都&#28... Read More

INTERNATIONAL PATENT: AGC INC., ＡＧＣ株式会社 FILES APPLICATION FOR "MIRROR SURFACE SHAPE MEASUREMENT DEVICE, MIRROR SURFACE SHAPE MEASUREMENT METHOD AND PLATE GLASS MANUFACTURING METHOD"

GENEVA, Dec. 9 -- AGC INC. (5-1, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008405), ＡＧＣ株式会社 (東京都千代田区&#2002... Read More

INTERNATIONAL PATENT: SHIN-ETSU CHEMICAL CO., LTD., 信越化学工業株式会社 FILES APPLICATION FOR "RARE EARTH SINTERED MAGNET AND METHOD FOR PRODUCING SAME"

GENEVA, Dec. 9 -- SHIN-ETSU CHEMICAL CO., LTD. (4-1, Marunouchi 1-chome, Chiyoda-ku, Tokyo1000005), 信越化学工業株式会社 (東京&#... Read More

INTERNATIONAL PATENT: PROTERIAL, LTD., 株式会社プロテリアル FILES APPLICATION FOR "METHOD FOR PRODUCING FE-CO-BASED ALLOY STRIP MATERIAL, FE-CO-BASED ALLOY STRIP MATERIAL AND LAMINATED CORE MEMBER"

GENEVA, Dec. 9 -- PROTERIAL, LTD. (6-36, Toyosu 5-chome, Koto-ku, Tokyo1350061), 株式会社プロテリアル (東京都江&#264... Read More

INTERNATIONAL PATENT: HITACHI, LTD., 株式会社日立製作所 FILES APPLICATION FOR "INFORMATION GENERATION DEVICE, INFORMATION GENERATION METHOD, VEHICLE, DISPLAY AND SPEAKER"

GENEVA, Dec. 9 -- HITACHI, LTD. (6-6, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008280), 株式会社日立製作所 (東京都千代&... Read More

INTERNATIONAL PATENT: TEIKYO UNIVERSITY, 学校法人帝京大学 FILES APPLICATION FOR "GENERATION MODEL TRAINING METHOD, TRAINING DEVICE, IMAGE GENERATION METHOD, IMAGE GENERATION DEVICE AND PROGRAM"

GENEVA, Dec. 9 -- TEIKYO UNIVERSITY (11-1, Kaga 2-chome, Itabashi-ku, Tokyo1738605), 学校法人帝京大学 (東京都板橋区&... Read More

INTERNATIONAL PATENT: TOKYO SEIMITSU CO., LTD., 株式会社東京精密 FILES APPLICATION FOR "WAFER DEFECT INSPECTION SYSTEM, WAFER DEFECT INSPECTION DEVICE AND WAFER DEFECT INSPECTION METHOD"

GENEVA, Dec. 9 -- TOKYO SEIMITSU CO., LTD. (2968-2, Ishikawa-machi, Hachioji-shi, Tokyo1928515), 株式会社東京精密 (東京都八&#295... Read More

INTERNATIONAL PATENT: SHIMADZU CORPORATION, 株式会社島津製作所 FILES APPLICATION FOR "DETECTION DEVICE AND DETECTION METHOD"

GENEVA, Dec. 9 -- SHIMADZU CORPORATION (1, Nishinokyo Kuwabara-cho, Nakagyo-ku, Kyoto-shi, Kyoto6048511), 株式会社島津製作所 (京都&#24... Read More

INTERNATIONAL PATENT: AMADA CO., LTD., 株式会社アマダ FILES APPLICATION FOR "WORKPIECE INTERFERENCE PREVENTION SYSTEM, WORKPIECE INTERFERENCE PREVENTION METHOD AND BENDING MACHINE"

GENEVA, Dec. 9 -- AMADA CO., LTD. (200, Ishida, Isehara-shi, Kanagawa2591196), 株式会社アマダ (神奈川県伊勢原&#24066... Read More

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