ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,142, issued on Feb. 3, was assigned to Dolby Laboratories Licensing Corp. (San Francisco). "System and method for enhancement of a degraded ... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,541,804, issued on Feb. 3, was assigned to Systemex Energies Inc. (Laval, Canada). "Power control device" was invented by Simon Jasmin (Montreal... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,539,072, issued on Feb. 3, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo). "Biological information detection device and biological informatio... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,540,851, issued on Feb. 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Semiconductor device measuring device and meth... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,029, issued on Feb. 3, was assigned to Aristocrat Technologies Australia Pty Ltd. (North Ryde, Australia). "Gaming device" was invented by N... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,539,953, issued on Feb. 3, was assigned to Brunswick Corp. (Mettawa, Ill.). "Configurable shift and throttle mechanism for tiller of marine driv... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,541,299, issued on Feb. 3, was assigned to ATOMBEAM TECHNOLOGIES INC. (Moraga, Calif.). "System and method for codebook management based on data... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,541,066, issued on Feb. 3, was assigned to Global Technology Inc. (Ningbo, China). "Bidirectional optical module with separated subassemblies" w... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,923, issued on Feb. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Method and apparatus for down-sampling and up-... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,540,976, issued on Feb. 3, was assigned to UL LLC (Northbrook, Ill.). "Systems and methods for parallel electrical endurance testing of contacts... Read More