US Patent Issued to SAMSUNG ELECTRONICS on Feb. 3 for "Semiconductor device measuring device and method for measuring semiconductor device" (South Korean Inventors)

ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,540,851, issued on Feb. 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Semiconductor device measuring device and method for measuring semiconductor device" was invented by Hyun Woo Ryoo (Suwon-si, South Korea), Da Hee Yoon (Gwangju, South Korea), Jung Hoon Byun (Seoul, South Korea), Dong-Ryul Lee (Goyang-si, South Korea), Woo Yun Lee (Hwaseong-si, South Korea), Dong Chul Ihm (Suwon-si, South Korea) and Chung Sam Jun (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device measuring device includes: a light generator which generates light; a polarizer which polarizes the light; a wafer stage i...