ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,521,630, issued on Jan. 13, was assigned to Tencent Technology Co. Ltd. (Shenzhen, China). "Methods, terminal device, and storage medium for pi... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,521,550, issued on Jan. 13, was assigned to Soin Neuroscience LLC (Dayton, Ohio). "Tunable electrical noise signal technologies" was invented b... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,236, issued on Jan. 13. "Sinusoidal blade apparatus" was invented by David M. Patrick (Ladera Ranch, Calif.). According to the abstract* r... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,526,610, issued on Jan. 13, was assigned to ORANGE (Issy-les-Moulineaux, France). "Message transmission in a multi-terminal context" was invent... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,678, issued on Jan. 13, was assigned to Microsoft Technology Licensing LLC (Redmond, Wash.). "Finding semantically related security informa... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,379, issued on Jan. 13, was assigned to Dell Products LP (Round Rock, Texas). "Cloning a clustered file system" was invented by Ramesh Kann... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,526,664, issued on Jan. 13, was assigned to LG Electronics Inc. (Seoul, South Korea). "Method and apparatus for performing measurement under a ... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,526,763, issued on Jan. 13, was assigned to QUALCOMM Inc. (San Diego). "Positioning fusion based on information from sidelink device" was inven... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,883, issued on Jan. 13, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo). "Floating image display device and floating image display method... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,620, issued on Jan. 13, was assigned to HITACHI HIGH-TECH ANALYSIS Corp. (Tokyo). "X-ray inspection apparatus and method of inspection with... Read More