ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,989, issued on Aug. 5, was assigned to Intel NDTM US LLC (Santa Clara, Calif.). "Zero voltage program state detection" was invented by Krist... Read More
ALEXANDRIA, Va., Aug. 6 -- United States Patent no. D1,087,070, issued on Aug. 5. "Stylistic trim plate to cover electronics in a housing for an integrated fiber platform" was invented by Eric Crawfo... Read More
ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,382,750, issued on Aug. 5, was assigned to Seoul Semiconductor Co. Ltd. (Ansan-si, South Korea). "Light emitting diode and light emitting module... Read More
ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,382,639, issued on Aug. 5, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Three-dimensional memory device and m... Read More
ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,378,020, issued on Aug. 5, was assigned to ISHIDA Co. LTD. (Kyoto, Japan). "Bagmaking and packaging apparatus" was invented by Ryota Nagashima (... Read More
ALEXANDRIA, Va., Aug. 6 -- United States Patent no. D1,086,973, issued on Aug. 5, was assigned to DEERE & COMPANY (Moline, Ill.). "Work vehicle canopy" was invented by Maria Fernanda Davila Hernandez... Read More
ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,380,439, issued on Aug. 5, was assigned to Ava Labs Inc. (New York). "Authenticated cross-subnet communication" was invented by Michael Edmond K... Read More
ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,382,241, issued on Aug. 5, was assigned to HYUNDAI MOTOR COMPANY (Seoul, South Korea) and KIA Corp. (Seoul, South Korea). "Geo-fence alarm metho... Read More
ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,382,527, issued on Aug. 5, was assigned to Telefonaktiebolaget LM Ericsson (Publ) (Stockholm). "Cell ID selection in multi cell ID scenarios" wa... Read More
ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,669, issued on Aug. 5, was assigned to KLA Corp. (Milpitas, Calif.). "Massive overlay metrology sampling with multiple measurement columns" ... Read More