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INTERNATIONAL PATENT: FANUC CORPORATION, ファナック株式会社 FILES APPLICATION FOR "CONTROL DEVICE AND PROGRAM"

GENEVA, Nov. 10 -- FANUC CORPORATION (3580, Shibokusa Aza-Komanba, Oshino-mura, Minamitsuru-gun, Yamanashi4010597), ファナック株式会社 (山&#... Read More


INTERNATIONAL PATENT: MITSUBISHI ELECTRIC BUILDING SOLUTIONS CORPORATION, 三菱電機ビルソリューションズ株式会社, MITSUBISHI ELECTRIC CORPORATION, 三菱電機株式会社 FILES APPLICATION FOR "EXAMINATION ASSISTANCE DEVICE, EXAMINATION ASSISTANCE SYSTEM AND EXAMINATION ASSISTANCE METHOD"

GENEVA, Nov. 10 -- MITSUBISHI ELECTRIC BUILDING SOLUTIONS CORPORATION (7-1, Yurakucho 1-chome, Chiyoda-ku, Tokyo1000006), 三菱電機ビルソリュ&#1254... Read More


INTERNATIONAL PATENT: TOKYO ELECTRON LIMITED, 東京エレクトロン株式会社 FILES APPLICATION FOR "SUBSTRATE PROCESSING DEVICE AND SUBSTRATE PROCESSING METHOD"

GENEVA, Nov. 10 -- TOKYO ELECTRON LIMITED (3-1, Akasaka 5-chome, Minato-ku, Tokyo1076325), 東京エレクトロン株式会社 (東&#2... Read More


INTERNATIONAL PATENT: MITSUBISHI ELECTRIC CORPORATION, 三菱電機株式会社 FILES APPLICATION FOR "CONTROL APPARATUS, CONTROL METHOD AND CONTROL SYSTEM"

GENEVA, Nov. 10 -- MITSUBISHI ELECTRIC CORPORATION (7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo1008310), 三菱電機株式会社 (東京都&#2131... Read More


INTERNATIONAL PATENT: NEC CORPORATION, 日本電気株式会社 FILES APPLICATION FOR "IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, RECORDING MEDIUM, SELF-PROPELLED ROBOT AND ARTICLE MANAGEMENT SYSTEM"

GENEVA, Nov. 10 -- NEC CORPORATION (7-1, Shiba 5-chome, Minato-ku, Tokyo1088001), 日本電気株式会社 (東京都港区芝&#20... Read More


INTERNATIONAL PATENT: SONY SEMICONDUCTOR SOLUTIONS CORPORATION, ソニーセミコンダクタソリューションズ株式会社 FILES APPLICATION FOR "IMAGE SENSOR"

GENEVA, Nov. 10 -- SONY SEMICONDUCTOR SOLUTIONS CORPORATION (4-14-1 Asahi-cho, Atsugi-shi, Kanagawa2430014), ソニーセミコンダクタソ&#1... Read More


INTERNATIONAL PATENT: NGK INSULATORS, LTD., 日本碍子株式会社 FILES APPLICATION FOR "METHOD FOR PRODUCING BETA-ALUMINA SINTERED COMPACT"

GENEVA, Nov. 10 -- NGK INSULATORS, LTD. (2-56 Suda-cho, Mizuho-ku, Nagoya-shi, Aichi4678530), 日本碍子株式会社 (愛知県名古... Read More


INTERNATIONAL PATENT: HAKARI CORPORATION, 株式会社秤 FILES APPLICATION FOR "ANALYSIS PROGRAM, ANALYSIS SYSTEM, COMPUTER DEVICE AND ANALYSIS METHOD"

GENEVA, Nov. 10 -- HAKARI CORPORATION (Sagami Bld. 2F, 13-6, Ginza 7-chome, Chuo-ku, Tokyo1040061), 株式会社秤 (東京都中央区銀&#... Read More


INTERNATIONAL PATENT: THE YOKOHAMA RUBBER CO., LTD., 横浜ゴム株式会社 FILES APPLICATION FOR "METHOD FOR INSPECTING TIRE MOLDING APPARATUS AND METHOD FOR MOLDING TIRE"

GENEVA, Nov. 10 -- THE YOKOHAMA RUBBER CO., LTD. (2-1, Oiwake, Hiratsuka-shi, Kanagawa2548601), 横浜ゴム株式会社 (神奈川県&#2417... Read More


INTERNATIONAL PATENT: TAKAOKA TOKO CO., LTD., 株式会社東光高岳 FILES APPLICATION FOR "SCANNING STAGE"

GENEVA, Nov. 10 -- TAKAOKA TOKO CO., LTD. (6-36, Toyosu 5-chome, Koto-ku, Tokyo1350061), 株式会社東光高岳 (東京都江東&#213... Read More