ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,032, issued on Jan. 20, was assigned to Wisconsin Alumni Research Foundation (Madison, Wis.). "Methods and culture substrates for controlle... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,528,610, issued on Jan. 20, was assigned to Altria Client Services LLC (Richmond, Va.). "Filling station for heat-not-burn (HNB) aerosol-genera... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,919, issued on Jan. 20, was assigned to University of Florida Research Foundation Inc. (Gainesville, Fla.). "Relevance factor variation aut... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,528,500, issued on Jan. 20, was assigned to GM Global Technology Operations LLC (Detroit). "System and method for planning a path for a vehicle... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,531,634, issued on Jan. 20, was assigned to DELTA ELECTRONICS INC. (Taoyuan, Taiwan). "Optical tunnel network system and fault diagnosis method... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,531,991, issued on Jan. 20, was assigned to BEIJING BYTEDANCE NETWORK TECHNOLOGY Co. LTD. (Beijing) and BYTEDANCE INC. (Los Angeles). "Coding o... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,782, issued on Jan. 20, was assigned to ThruWave Inc. (Seattle). "Systems and methods for image beat pattern mitigation" was invented by An... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,527,369, issued on Jan. 20. "Safety vest with protection plates" was invented by Brady Drayton (Boston). According to the abstract* released b... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,532,551, issued on Jan. 20, was assigned to BOE Technology Group Co. Ltd. (Beijing). "Visible light communication device, display substrate, di... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,552, issued on Jan. 20, was assigned to KLA Corp. (Milpitas, Calif.). "Angular averaging calibration on bare wafer metrology tools for ESFQ... Read More