ALEXANDRIA, Va., July 3 -- United States Patent no. 12,349,602, issued on July 1, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Bottom electrode via and conductive b... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,347,177, issued on July 1, was assigned to Nokia Technologies Oy (Espoo, Finland). "Method and device for 3D object detection" was invented by Y... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,346,083, issued on July 1, was assigned to CANON K.K. (Tokyo). "Information processing apparatus, information processing method, production syst... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. D1,081,504, issued on July 1, was assigned to VOLVO TRUCK Corp. (Gothenburg, Sweden). "Tread for step" was invented by Alexandre Henriques (Greensb... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,348,966, issued on July 1, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Method for controlling access of terminal to p... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,348,873, issued on July 1, was assigned to HTC Corp. (Taoyuan, Taiwan). "Method for controlling shooting parameters of camera and tracking devic... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,347,603, issued on July 1, was assigned to TEXAS INSTRUMENTS Inc. (Dallas). "Molded inductor with magnetic core having mold flow enhancing chann... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,348,970, issued on July 1, was assigned to Huawei Technologies Co. Ltd (Shenzhen, China). "NFC tag verification method and related device" was i... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,343,046, issued on July 1, was assigned to WARSAW ORTHOPEDIC Inc. (Warsaw, Ind.). "Spinal construct" was invented by Jason M. May (Collierville,... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,660, issued on July 1, was assigned to SHIN-ETSU HANDOTAI Co. LTD. (Tokyo). "Method for evaluating crystal defects in silicon carbide single... Read More