ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,463,163, issued on Nov. 4, was assigned to STMicroelectronics S.r.l. (Agrate Brianza, Italy). "Integrated circuit chip including a passivation n... Read More
ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,463,413, issued on Nov. 4, was assigned to SiliconBrite Technologies Inc. (Santa Clara, Calif.). "Electronic circuit for overcurrent protection"... Read More
ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,460,705, issued on Nov. 4. "Multi-directional radial clutch to store potential energy" was invented by Matthew Higgins (Albuquerque, N.M.). Acc... Read More
ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,460,533, issued on Nov. 4, was assigned to Halliburton Energy Services Inc. (Houston). "Tool and method to make high resolution and high penetra... Read More
ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,463,901, issued on Nov. 4, was assigned to Huawei Technologies'Co.'Ltd.' (Shenzhen, China). "Method and apparatus for processing forwarding entr... Read More
ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,462,628, issued on Nov. 4, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo). "Equipment server, device server, and communication system" was in... Read More
ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,789, issued on Nov. 4, was assigned to Google LLC (Mountain View, Calif.). "Redistributing tensor elements between machine learning computin... Read More
ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,464,940, issued on Nov. 4, was assigned to OTI Lumionics Inc. (Mississauga, Canada). "Method for selectively depositing a conductive coating ove... Read More
ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,462,500, issued on Nov. 4, was assigned to Snap Inc. (Santa Monica, Calif.). "Securing of augmented reality (AR) systems" was invented by Dheere... Read More
ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,142, issued on Nov. 4, was assigned to YC Corp. (Gyeonggi-do, South Korea). "Semiconductor wafer test system for controlling supply of power... Read More