ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,468,566, issued on Nov. 11, was assigned to Loophole Labs Inc. (New York). "Reduced downtime migration of virtualized software services" was in... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,415, issued on Nov. 11, was assigned to Cummins Inc. (Columbus, Ind.). "Air handling systems and controls for internal combustion engines o... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,471,492, issued on Nov. 11, was assigned to Semiconductor Energy Laboratory Co. Ltd. (Japan). "Organic compound, light-emitting device, light-e... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. D1,101,832, issued on Nov. 11, was assigned to Long Liang (Jiujiang, China). "Hunting camera" was invented by Long Liang (Jiujiang, China). The p... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,511, issued on Nov. 11, was assigned to KOTOBUKIYA FRONTE Co. LTD. (Japan). "Damping material" was invented by Kazuki Fukui (Saitama, Japan... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,986, issued on Nov. 11, was assigned to TDK Corp. (Tokyo). "Antenna device and antenna module" was invented by Kenichi Tezuka (Tokyo), Yasu... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,938, issued on Nov. 11, was assigned to PRIME PLANET ENERGY & SOLUTIONS INC. (Tokyo), TOYOTA JIDOSHA K.K. (Aichi-Ken, Japan) and TOYOTA BATT... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,742, issued on Nov. 11, was assigned to Tokyo Electron Ltd. (Tokyo). "Film thickness analysis method, film thickness analysis device and st... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,470,990, issued on Nov. 11, was assigned to Telefonaktiebolaget LM Ericsson (Publ) (Stockholm). "Method for network-guided WD cell reselection"... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,579, issued on Nov. 11, was assigned to YC Corp. (Gyeonggi-Do, South Korea). "Semiconductor test apparatus capable of inducing reduction of... Read More