U.S., March 19 -- An application to own the trademark for 'CONNECTED METROLOGY' has been filed on Jul. 04, 2024.
Owner(s):
LayTec Aktiengesellschaft; Seesener Straße 10-13, 10709 Berlin, GERMANY
Goods and/or Services:
For: Downloadable software for aggregating and combining measurement parameters of semiconductor wafers in the production of semiconductor devices; Downloadable software for analysing and interpreting in-situ and in-line measurement parameters before, during and after thin film deposition, thin film etching and other treatment and characterisation steps; Downloadable software for improving the yield and the stability of production processes and their analysis results for statistical process control in the production of sem...