US Patent Issued to ZTE on Aug. 26 for "Error vector magnitude measurement method, transmitter and computer- readable storage medium" (Chinese Inventor)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,401,447, issued on Aug. 26, was assigned to ZTE Corp. (Shenzhen, China).

"Error vector magnitude measurement method, transmitter and computer- readable storage medium" was invented by Kun Niu (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are an Error Vector Magnitude (EVM) measurement method, a transmitter, and a computer-readable storage medium. The EVM measurement method includes: acquiring a cell configuration parameter from a control terminal device; generating a test data source according to the cell configuration parameter; obtaining a measurement signal according to the test data source; determining an error vector mag...