US Patent Issued to ZHENGZHOU UNIVERSITY OF LIGHT INDUSTRY on March 25 for "Material completeness detection method and apparatus, and storage medium" (Chinese Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,260,540, issued on March 25, was assigned to ZHENGZHOU UNIVERSITY OF LIGHT INDUSTRY (Zhengzhou, China).

"Material completeness detection method and apparatus, and storage medium" was invented by Hao Li (Zhengzhou, China), Xinyu Yan (Zhengzhou, China), Gen Liu (Zhengzhou, China), Haoqi Wang (Zhengzhou, China), Zhongshang Zhai (Zhengzhou, China), Bing Li (Zhengzhou, China), Yuyan Zhang (Zhengzhou, China) and Yan Liu (Zhengzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A material completeness detection method configured to detect whether materials of a target object in a physical production line are complete, includes: inputting an image of th...