US Patent Issued to Zhejiang University on Nov. 4 for "Crop yield estimation method and system based on grade identification and weight decision-making" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,457,917, issued on Nov. 4, was assigned to Zhejiang University (Hangzhou, China).

"Crop yield estimation method and system based on grade identification and weight decision-making" was invented by Fei Liu (Hangzhou, China), Rui Yang (Hangzhou, China), Jun Zhou (Hangzhou, China), Xiangyu Lu (Hangzhou, China), Riqun Ni (Hangzhou, China), Mengyuan Chen (Hangzhou, China) and Jie Jiao (Hangzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a crop yield estimation method and system based on level identification and weighted decision fusion. The method includes: inputting an obtained visible light image of a target crop f...