US Patent Issued to ZHEJIANG UNIVERSITY on Dec. 16 for "Confocal scanning dark field microscopy imaging method and device" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,554, issued on Dec. 16, was assigned to ZHEJIANG UNIVERSITY (Hangzhou, China).

"Confocal scanning dark field microscopy imaging method and device" was invented by Cuifang Kuang (Hangzhou, China), Yuxuan Qiu (Hangzhou, China), Yusen Zhang (Hangzhou, China) and Xu Liu (Hangzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A confocal scanning dark field microscopy imaging method and device, comprising: modulating a phase of a laser beam emitted by a laser into a 0-2Pi Pi vortex phase, where nless than3; conjugating the modulated laser beam with an entrance pupil of an objective lens of a confocal scanning microscope, so that a focusing spot of...