US Patent Issued to ZHEJIANG LAB on Oct. 7 for "Integrated multi-parameter sensor based on optoelectronic integration and fabrication method thereof" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,031, issued on Oct. 7, was assigned to ZHEJIANG LAB (Hangzhou, China).

"Integrated multi-parameter sensor based on optoelectronic integration and fabrication method thereof" was invented by Shan Wang (Hangzhou, China), Xiaoyu Wang (Hangzhou, China), Qi Wang (Hangzhou, China) and Lei Zhang (Hangzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The provided is an integrated multi-parameter (pressure, temperature, proximity) sensor based on optoelectronic integration and a fabrication method thereof. The sensor includes a flexible optical waveguide based on an optical mechanism and a flexible interdigitated electrode film based on an electrical...