ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,080, issued on Dec. 2, was assigned to ZHEJIANG HUARAY TECHNOLOGY Co. LTD. (Hangzhou, China).
"Systems and methods for object measurement" was invented by Yu Liu (Hangzhou, China), Yunke Zhou (Hangzhou, China) and Lu Zhou (Hangzhou, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to systems and methods for object measurement. The systems may obtain an image of an object with a light bar acquired by an imaging device. The light bar may be formed by an optical sensor irradiating the object with a light beam. The systems may obtain a measurement model. The measurement model may be configured to simulate a curved surfa...