US Patent Issued to Zhaoqing University on July 8 for "Multiple superposition detection system and method for capacitor appearance defects based on visual detection" (Chinese Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,700, issued on July 8, was assigned to Zhaoqing University (Zhaoqing, China).

"Multiple superposition detection system and method for capacitor appearance defects based on visual detection" was invented by Rongrong Chen (Zhaoqing, China), Shenglin He (Zhaoqing, China), Liping Wang (Zhaoqing, China) and Zhenyu Lao (Zhaoqing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure provides a multiple superposition detection system and a multiple superposition detection method for capacitor appearance defects based on visual detection, relating to a capacitor detection field. The detection system includes a conveying mechanism, a visual dete...