US Patent Issued to Ze Chen on July 22 for "Self-test mechanisms for end-of-life detection and response for circuit interrupter devices" (Chinese Inventors)

ALEXANDRIA, Va., July 23 -- United States Patent no. 12,368,015, issued on July 22, was assigned to Ze Chen (Yueqing, China).

"Self-test mechanisms for end-of-life detection and response for circuit interrupter devices" was invented by Ze Chen (Yueqing, China) and Gui Chen (Wenzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A circuit for a circuit interrupter is provided. The circuit may in include a first SCR configured to receive a first trigger signal at a gate of the first SCR, a second SCR configured to receive a second trigger signal at a gate of the second SCR, and a third SCR configured to receive a third trigger signal at a gate of the third SCR. A cathode of the first SCR may be connecte...