ALEXANDRIA, Va., July 23 -- United States Patent no. 12,366,852, issued on July 22, was assigned to Yokogawa Electric Corp. (Tokyo).
"Analysis apparatus, analysis method and computer-readable medium" was invented by Nobuaki Ema (Tokyo), Takahiro Kambe (Tokyo), Tatenobu Seki (Tokyo) and Masato Annen (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an analysis apparatus comprising: a variation model storage unit configured to store a plurality of variation models indicating variation in characteristics of a plant corresponding to an operating condition of the plant; a model extraction unit configured to acquire structure information indicating a structure model of an analysis target plant and ...