US Patent Issued to YOKOGAWA ELECTRIC, YOKOGAWA TEST & MEASUREMENT on Dec. 9 for "Measurement apparatus, measurement method, and program" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,492,941, issued on Dec. 9, was assigned to YOKOGAWA ELECTRIC Corp. (Tokyo) and YOKOGAWA TEST & MEASUREMENT Corp. (Tokyo).

"Measurement apparatus, measurement method, and program" was invented by Gentaro Ishihara (Hachioji, Japan) and Hiroaki Matsukawa (Hachioji, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement apparatus 1 according to this disclosure includes a controller 80 and a spectroscope 10 having an optical element in which an aperture 132a to pass light L1 to be measured is formed. The controller 80 executes a first process to generate a synthetic spectrum Sr(i) of the narrowed light L1 by synthesizing at least a first spectrum ...