US Patent Issued to YC on Nov. 11 for "Semiconductor test apparatus capable of inducing reduction of power consumption" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,579, issued on Nov. 11, was assigned to YC Corp. (Gyeonggi-Do, South Korea).

"Semiconductor test apparatus capable of inducing reduction of power consumption" was invented by Hyo Sang Jo (Uiwang-si, South Korea), Wan Soon Park (Yongin-si, South Korea), Yong Hyun Kim (Seoul, South Korea) and Jae Hoon Joo (Yongin-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor test apparatus is provided. The semiconductor test apparatus includes: a test management unit determining a test mode, generating a test signal in accordance with the determined test mode, and transmitting the test signal to fail memories; and one or more fail memo...