US Patent Issued to YC on Dec. 16 for "Semiconductor test apparatus using FPGA and memory control method for semiconductor test" (South Korean Inventor)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,419, issued on Dec. 16, was assigned to YC Corp. (Gyeonggi-Do, South Korea).

"Semiconductor test apparatus using FPGA and memory control method for semiconductor test" was invented by Wan Soon Park (Yongin-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor test apparatus comprises a failure memory (FM) block configured to store failure data generated from a result of testing a semiconductor device, a buffer memory (BM) block to/in which the failure data stored in the FM block is configured to be copied/stored, and a field programmable gate array (FPGA) configured to perform a first control operation to control the FM bloc...