US Patent Issued to Yangtze Memory Technologies on Sept. 23 for "Digital verify failbit count (VFC) circuit" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,424,299, issued on Sept. 23, was assigned to Yangtze Memory Technologies Co. Ltd. (Wuhan, China).

"Digital verify failbit count (VFC) circuit" was invented by Teng Chen (Wuhan, China), Xiaojiang Guo (Wuhan, China) and Masao Kuriyama (Wuhan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A verify failbit count (VFC) circuit includes a counter including a plurality of counter stages coupled one after another and including one or more cache stages in a cache group and a plurality of reception stages divided into a plurality of reception groups each including one or more reception stages of the plurality of reception stages. Each of the reception sta...