US Patent Issued to Yangtze Memory Technologies on June 3 for "Digital verify failbit count (VFC) circuit" (Chinese Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,322,456, issued on June 3, was assigned to Yangtze Memory Technologies Co. Ltd. (Wuhan, China).

"Digital verify failbit count (VFC) circuit" was invented by Teng Chen (Wuhan, China) and Masao Kuriyama (Wuhan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A verify failbit count (VFC) circuit includes a counter circuit and a transcoder circuit. The counter circuit includes a counter. The counter is configured to count one or more fail bits based on results of a verification operation of a memory device to obtain a count result in unary format. The transcoder circuit includes a transcoder coupled to the counter. The transcoder is configured to transc...