US Patent Issued to Yangtze Memory Technologies on June 17 for "Digital Verify Failbit Count (VFC) circuit" (Chinese Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,334,162, issued on June 17, was assigned to Yangtze Memory Technologies Co. Ltd. (Wuhan, China).

"Digital Verify Failbit Count (VFC) circuit" was invented by Teng Chen (Wuhan, China) and Masao Kuriyama (Wuhan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A failbit counting method includes controlling a counter of a verify failbit count (VFC) circuit to count fail bits in a bit group including one or more verification bits, received at an input of the counter, to obtain a count result in unary format. Each of the one or more verification bits is a fail bit or a pass bit. The count result in unary format is stored in the counter. The method furthe...