ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,124, issued on Nov. 4, was assigned to YAMAICHI ELECTRONICS Co. LTD. (Tokyo).
"Contact pin and socket for inspection" was invented by Junichi Miyaaki (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a contact pin and a socket for inspection that can improve contact reliability to an IC package. An embodiment includes: an electrically conductive electrical contact extending from a base end to a tip and having an elastic deformation part elastically expandable and compressible in the extending direction formed between the base end and the tip; and an electrically conductive thermal contact extending from a base end to a tip and having...