US Patent Issued to Yamaha Robotics on Nov. 11 for "Defect detection device and defect detection method" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,727, issued on Nov. 11, was assigned to Yamaha Robotics Co. Ltd. (Tokyo).

"Defect detection device and defect detection method" was invented by Hiroshi Munakata (Tokyo) and Takuya Adachi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A defect detection device (100) which detects a defect of a semiconductor device (10) includes: a standing wave generator (20), applying a standing wave (30) to the semiconductor device (10) to apply a suction force to a wire (13); cameras (41, 42); and a control part (50), adjusting an operation of a standing wave generator (20) and performing defect detection on the semiconductor device (10). The control part (...