US Patent Issued to Yale University on Sept. 30 for "Interpretable deep machine learning for clinical radiology" (Connecticut Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,431,244, issued on Sept. 30, was assigned to Yale University (New Haven, Conn.).

"Interpretable deep machine learning for clinical radiology" was invented by James S. Duncan (Madison, Conn.), Brian Letzen (Orange, Conn.), Julius Chapiro (New Haven, Conn.) and Clinton Wang (New Haven, Conn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "One aspect of the invention provides a computer-implemented method of identifying one or more clinical factors associated with an artificial intelligence prediction. The computer implemented method includes: applying a previously trained deep neural network to one or more images for a subject to produce a prediction, the...